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Stress-Optical Effect Analysis On Silicon-On-Insulator Planar Waveguide

A. Aziz, N. Nadia and Haroon, Hazura and Abdul Razak, Hanim and Mohd Zain, Anis Suhaila and Othman, Syariffah and Salehuddin, Fauziyah (2017) Stress-Optical Effect Analysis On Silicon-On-Insulator Planar Waveguide. Journal Of Telecommunication, Electronic And Computer Engineering (JTEC) , 9 (3). pp. 101-104. ISSN 2180-1843

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Abstract

Stress application can be used to modify the optical properties of a device. The stress-optic effect has been experimentally measured in strained silicon, making it a promising candidate material for realizing active photonic devices, such as optical modulators and switches. In this paper, we investigated the stress-optic effect induced by applied strain gradient in the silicon optical waveguides. The relation between stress-optic effect, strain, birefringence and the change in the optical properties is investigated. The structure of nanometer waveguide is analyzed by using the Multiphysics modeling to show the effects of stress analysis. The stress effects are then evaluated by the Structural Mechanics modules.

Item Type: Article
Subjects: T Technology > T Technology (General)
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Electronics and Computer Engineering
Depositing User: Mohd Hannif Jamaludin
Date Deposited: 28 May 2018 07:47
Last Modified: 28 May 2018 07:47
URI: http://eprints.utem.edu.my/id/eprint/20836

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