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Effect Of Different Pyrolysis And Annealing Temperature On Structural And Electrical Properties Of K0.5Na0.5(NbO)3 Thin Film

Chahit, Dyana (2017) Effect Of Different Pyrolysis And Annealing Temperature On Structural And Electrical Properties Of K0.5Na0.5(NbO)3 Thin Film. Project Report. Universiti Teknikal Malaysia Melaka, Melaka, Malaysia. (Submitted)

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Effect Of Different Pyrolysis And Annealing Temperature On Structural And Electrical Properties Of K0.5Na0.5(NbO)3 Thin Film.pdf - Submitted Version

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Abstract

Piezoelectric ceramic thin film have attracted the worldwide attention to use it for the electronic device applications such as sensor,actuator and etc.However the material used that is lead zirconia titanate (PZT) is not friendly environmental as it is containing 60 % of lead that may cause the environmental problem.To solve the problem,K0.5Na0.5NbO3 (KNN) can be the alternative material to replace PZT.The purpose of this study is to investigate the effect of the different pyrolysis and annealing temperature on the structural properties of K0.5Na0.5NbO3 thin film.In this experiment,sol-gel via spin coating technique is used to fabricate the K0.5Na0.5NbO3 thin film.The raw materials used in this experiment are sodium acetate,potassium acetate and niobium penthaethoxide.These three raw materials will be added with the 2-metoxyethanol as a solvent and acetylacetone as the chelating agent respectively to obtain the 1.0 M sol concentration.Next,the sol will be deposited on the silicon substrate and spin coated at the speed of 3000 rpm for 30 second until the desired thickness of the film is achieved.Then,the thin film will be calcined at the different temperature for 2 minutes and annealed at the different temperatures for 5 minutes. Lastly,the KNN thin film will be analyzed by using the X-ray diffraction,Raman spectroscopy,scanning electron microscopy and resistivity test to determine its electrical and structural properties.After the analysis, it can be concluded that the temperature have affected the fabrication of the KNN thin film in order to get the optimum KNN thin film that comparable to the PZT.

Item Type: Monograph (Project Report)
Uncontrolled Keywords: Piezoelectric devices,Thin films -- > Electric properties,Piezoelectric ceramics.
Subjects: T Technology > T Technology (General)
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Manufacturing Engineering > Department of Engineering Materials
Depositing User: Mohd. Nazir Taib
Date Deposited: 20 Aug 2018 07:24
Last Modified: 20 Aug 2018 07:24
URI: http://eprints.utem.edu.my/id/eprint/21405

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