Jidin, Aiman Zakwan and Mispan, Mohd Syafiq and Hussin, Razaidi and Md Zin, Ahmad Ridhwan and Tuan Ab Razak, Tengku Farah Nurhidayu (2026) FSM-Based MBIST controller implementation using the March AZ2 test algorithm. IIUM Engineering Journal, Special Issue in Mechanical Engineering, 27 (1). pp. 292-303. ISSN 1511-788X
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Abstract
An efficient on-chip memory testing requires the use of a Memory Built-In Self-Test (MBIST) that applies a low-complexity test algorithm that offers excellent fault coverage, to ensure high test quality at a minimal cost. The March AZ2 algorithm, with 14N complexity, was previously established to balance the fault coverage and test complexity. It was previously implemented in an MBIST controller through an automatic generation process using an Electronic Design Automation (EDA) tool, which limits its customizability and optimization potential. This paper presents the implementation of an MBIST controller that employs the March AZ2 test algorithm and is based on a Finite-State Machine (FSM) architecture. The developed MBIST controller was implemented on a Field-Programmable Gate Array (FPGA) to validate its functionality and fault coverage. A comparison with an equivalent MBIST controller automatically generated using Siemens EDA Tessent MemoryBIST tool demonstrates that the proposed FSM-Based MBIST controller achieves 84% lower circuit area and 32% power consumption, while offering similar fault coverage.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | MBIST, March Test Algorithm, FPGA, FSM, and Memory Testing |
| Divisions: | Faculty Of Electronics And Computer Technology And Engineering |
| Depositing User: | Norfaradilla Idayu Ab. Ghafar |
| Date Deposited: | 04 Sep 2026 01:17 |
| Last Modified: | 04 Sep 2026 01:17 |
| URI: | http://eprints.utem.edu.my/id/eprint/30396 |
| Statistic Details: | View Download Statistic |
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