Electrosynthesized NiSe2 thin films and their characterization studies

T., Joseph Sahaya Anand and Abdul Aziz, Mohd Zaidan Bin and K.M.Rajan, Rajes (2012) Electrosynthesized NiSe2 thin films and their characterization studies. In: International Conference of Young Researchers on Advanced Materials, July 1 - 6, 2012, MATRIX Building, National University of Singapore (NUS), Singapore. (Unpublished)

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Nickel chalcogenides, specifically nickel selenide, NiSe2 thin films have been successfully deposited onto indium-tin-oxide (ITO) coated glass substrates and stainless steel substrates by electrodeposition technique. The effects of the deposition time on the growth, structural and optical properties of the films were then studied. X-ray diffraction (XRD) patterns have confirmed the polycrystalline NiSe2 phase formation. The results show that the intensity of XRD peaks for these materials increases with the increase of deposition time. UV -Vis spectrophotometric measurement revealed that the optical band gap values of the thin films decreased with the increase of deposition time and lie in the range of semiconductor properties. Surface morphology studies by scanning electron microscopy showed uniform and continuous thin film with layered structure surface.

Item Type: Conference or Workshop Item (Poster)
Subjects: T Technology > TJ Mechanical engineering and machinery
Divisions: Faculty of Manufacturing Engineering > Department of Engineering Materials
Depositing User: Dr. T. Joseph Sahaya Anand
Date Deposited: 26 Mar 2013 04:23
Last Modified: 28 May 2015 03:46
URI: http://eprints.utem.edu.my/id/eprint/6956
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