Structural and Morphology of Zinc Sulphide Thin Films on Various Temperature

Abdul Hamid, Afifah Maheran and Mohd Said, Muzalifah and Mohammed Napiah, Zul Atfyi Fauzan and Haron, Nor Zaidi (2011) Structural and Morphology of Zinc Sulphide Thin Films on Various Temperature. In: 2011 IEEE Regional Symposium on Micro and Nano Electronics (RSM 2011), September 28-30, 2011, Kota Kinabalu, Sabah, Malaysia.

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This study were focused on nanocrystalline structure and morphology on zinc sulphide thin film in four different temperature which are at 250 °C, 300 °C, 350 °C and 400 °C. Sol-gel technique is used to produce the thin films on quartz slide. The reaction of chemical obtained was a colloidal and transparent solution. There are EDX, SEM and XRD experiment were used to characterize the sample in each thin film. EDX analysis confirmed that the thin film consist of element zinc and sulphur. In SEM shows the film are thicker and have bigger grains size when the film annealed at 400 °C compared to temperature of 250 °C with the grain size between 26.8 - 60.3 nm and 22.3 -29.0 nm respectively. The thicknesses of the film are 93.79 nm, 107.2 nm, 119.1 nm and 127.3 nm from temperature of 250 °C to 400 °C respectively. XRD shows development of well-crystallized film with pure wurtzite structure after annealing. XRD spectrum indicates that the films are amorphous and have cubic zinc blend structure.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Electronics and Computer Engineering > Department of Computer Engineering
Date Deposited: 15 Jul 2013 04:07
Last Modified: 28 May 2015 03:57
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