Items where Author is "Md Salim, Sani Irwan"
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Article
Md Salim, Sani Irwan and Mohd Shaifullizan, Muhammad Aiman Akmal and Mohd Zin, Mohd Shahril Izuan and Samsudin, Sharatul Izah and Awang Md Isa, Azmi (2025) Performance evaluation of image classification models on resource-constrained STM32 microcontrollers. International Journal of Research and Innovation in Social Science (IJRISS), IX (X). pp. 2977-2986. ISSN 2454-6186
Mohd Zin, Mohd Shahril Izuan and Awang Md Isa, Azmi and Md Salim, Sani Irwan and Shaare, Muhammad Nurhaziq (2024) Optimizing hospital bed management system with IoT. International Journal of Academic Research in Business and Social Sciences, 14 (12). pp. 3982-3995. ISSN 2222-6990
Conference or Workshop Item
Edris, Muhammad Zuhair Bolqiah and Ahmad, Mohd Riduan and Hashim, Nik Mohd Zarifie and Shamsul Baharin, Shamsul Ammar and Md Salim, Sani Irwan and Mat Ibrahim, Masrullizam and Baharuddin, Mohd Zafri and Takayanagi, Yuji and Akita, Manabu and Morimoto, Takeshi and Kawasaki, Zen (2024) Localization of narrow bipolar events over Sumatra Island based on VHF interferometer and magnetic direction finder systems. In: ICLP 2024; 37th International Conference on Lightning Protection, 1 September 2024 through 7 September 2024, Dresden, Germany.
Edris, Muhammad Zuhair Bolqiah and Ahmad, Mohd Riduan and Hashim, Nik Mohd Zarifie and Baharin, Shamsul Ammar Shamsul and Md Salim, Sani Irwan and Mat Ibrahim, Masrullizam and Baharuddin, Mohd Zafri and Takayanagi, Yuji and Akita, Manabu and Morimoto, Takeshi (2024) Localization of narrow bipolar events over Sumatra Island based on VHF interferometer and magnetic direction finder systems. In: ICLP 2024 - 37th International Conference on Lightning Protection.
Abd Manap, Nurulfajar and Md Salim, Sani Irwan and Haron, Nor Zaidi (2006) Design & Development of a Robotic System Using LEGO Mindstorm. In: Seminar Pencapaian Penyelidikan KUTKM 2006, 2006, KUTKM, Melaka.
Technical Report
Md Salim, Sani Irwan and Lim, Kim Chuan and Mohd Yusof, Zulkalnain and Choo, Chin Yoon (2020) Accelerating Image Processing Of Wafer Inspection. [Technical Report] (Submitted)