Items where Author is "Muhamad, M. Rasat"
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Conference or Workshop Item
Omar, Ghazali and Tamaldin, Noreffendy and Muhamad, M. Rasat (2000) Correlation of silicon wafer strength to the surface morphology. In: (ICSE 2000)- IEEE International Conference on Semiconductor Electronics, 2000., 13-15 Nov 2000, Guoman Resort, Port Dickson.