Items where Author is " Zhang, J.F."

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Wan Muhamad Hatta, S.F. and Soin, N. and Abd Hadi, D. and Zhang, J.F. (2010) NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process. Microelectronics Reliability, 50 (9-11). pp. 1283-1289. ISSN 0026-2714

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