Items where Division is "Library > Technical Report > FKEKK" and Year is 2020

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Md Salim, Sani Irwan and Lim, Kim Chuan and Mohd Yusof, Zulkalnain and Choo, Chin Yoon (2020) Accelerating Image Processing Of Wafer Inspection. [Technical Report] (Submitted)

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Salehuddin, Fauziyah and Mohd Zain, Anis Suhaila and Haroon, Hazura and Abdul Razak, Hanim and Idris@Othman, Siti Khadijah and Ahmadi, Ibrahim (2020) Optimization Of Process Parameter Variation In Double-Gate FinFET Model On Electrical Characteristics Using Statistical Method For Reduced Variability And Enhanced Performance. [Technical Report] (Submitted)