Items where Author is "Wan Muhamad Hatta, S.F."
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Article
Wan Muhamad Hatta, S.F. and Abd. Hadi, D. and Soin, N. (2011) Laser Anneal-Induced Effects on the NBTI Degradation of Advanced-Process 45nm high-k PMOS. Advanced Materials Research, 189-19. pp. 1862-1866. ISSN 1662-8985
Wan Muhamad Hatta, S.F. and Soin, N. and Abd Hadi, D. and Zhang, J.F. (2010) NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process. Microelectronics Reliability, 50 (9-11). pp. 1283-1289. ISSN 0026-2714