Items where Author is " Zhang, J.F."
 | Up a level |
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 1.
Article
Wan Muhamad Hatta, S.F. and Soin, N. and Abd Hadi, D. and Zhang, J.F. (2010) NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process. Microelectronics Reliability, 50 (9-11). pp. 1283-1289. ISSN 0026-2714