A Web Based System For Evaluating Occupational Stress

Haron, Nor Zaidi and Siti Aisah , Mat Junos @ Yunus and Abdul Aziz, Amir Shah (2007) A Web Based System For Evaluating Occupational Stress. IEEE. pp. 136-139. ISSN 1536-1225 (Submitted)

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Memory Built-in Self Test (MBIST) or as some refer to it array built-in self-test is an amazing piece of logic. Without any direct connection to the outside world, a very complex embedded memory can be tested efficiently, easily and less costly. Modeling and simulation of Microcode MBIST is presented in this paper. The design architecture is written using Very High Speed Integrated Circuit Hardware Description Language (VHDL) code using Xilinx ISE tools. The architecture is modeled and synthesized using register transfer level (RTL) abstraction. Verification of this architecture is carried out by testing stuck at fault SRAM. Five BIST algorithms are implemented i.e MATS, MATS+, MARCH X, MARCH C and March C-to test the faulty SRAM

Item Type: Article
Uncontrolled Keywords: Job stress, Web-based instruction.
Subjects: T Technology > T Technology (General)
H Social Sciences > H Social Sciences (General)
Divisions: Faculty of Electronics and Computer Engineering > Department of Computer Engineering
Depositing User: Mr Mohamad Rashid Jantan
Date Deposited: 08 May 2013 03:20
Last Modified: 28 May 2015 03:51
URI: http://eprints.utem.edu.my/id/eprint/7668
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