Effect of Additives on Optical Measurements of NiSe2 Thin Films

T., Joseph Sahaya Anand and Abdul Aziz, Mohd Zaidan Bin and S., Shariza (2012) Effect of Additives on Optical Measurements of NiSe2 Thin Films. In: Malaysian Technical Universities Conference on Engineering and Technology (MUCET) 2012, November 20 - 21, 2012, SERI Malaysia Hotel, Kangar.

This is the latest version of this item.

[img] PDF
MUCET_2012_Anand_FKP.pdf
Restricted to Registered users only

Download (370kB) | Request a copy

Abstract

Nickel selenide, NiSe2 is one of the absorbent materials used in thin film technology in photoelectrochemical (PEC) cell. Electrodeposition is a preferred method to produce NiSe2 thin films due to its advantages such as the possibility of large scale production, minimum waste of components, easy monitoring of deposition process and large area deposition. Ethylenediaminetetraacetic acid (EDTA) and triethanolamine (TEA) were employed as the additives during the deposition. The samples were deposited within 30 minutes deposition time according to potential acquired from cyclic voltammetry measurements. Thin film thickness measurements, structural studies, optical studies, morphological and compositional analysis as well as Mott-Schottky measurements were carried out.

Item Type: Conference or Workshop Item (Speech)
Additional Information: Obtained special award as MUCET2012 INDUSTRIAL AWARD
Uncontrolled Keywords: thin film; photoelectrochemical; nickel selenide; electrodeposition; additive.
Subjects: T Technology > TJ Mechanical engineering and machinery
Divisions: Faculty of Manufacturing Engineering > Department of Engineering Materials
Depositing User: Dr. T. Joseph Sahaya Anand
Date Deposited: 20 Aug 2013 00:33
Last Modified: 28 May 2015 04:02
URI: http://eprints.utem.edu.my/id/eprint/9250
Statistic Details: View Download Statistic

Available Versions of this Item

Actions (login required)

View Item View Item