Items where Author is "Hamdioui, Said"

Haron, Nor Zaidi and Hamdioui, Said (2011) On Defect Oriented Testing for Hybrid CMOS/memristor Memory. In: Asian Test Symposium 2011, 20-23 November 2011, New Delhi.

Haron, Nor Zaidi and Hamdioui, Said (2011) Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories. In: Design, Automation & Test in Europe Conference @ Exhibition, 14-18 March 2011, Grenoble, France.

Haron, Nor Zaidi and Hamdioui, Said (2011) Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories. ACM Journal on Emerging Technologies in Computing Systems, 7 (1). pp. 1-19. ISSN 1550-4832

Haron, Nor Zaidi and Hamdioui, Said (2011) Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories. In: Design, Automation & Test in Europe Conference , 14-18 March 2011, Grenoble, France.

Haron, Nor Zaidi and Hamdioui, Said (2011) On Defect Oriented Testing for Hybrid CMOS/memristor Memory. In: 2011 Asian Test Symposium, 20-23 November 2011, New Delhi, India.