Experimental investigation on material migration phenomena in micro-EDM of reaction-bonded silicon carbide

Liew , Pay Jun and Yan , Jiwang and Kuriyagawa, Tsunemoto (2013) Experimental investigation on material migration phenomena in micro-EDM of reaction-bonded silicon carbide. Applied Surface Science. pp. 731-743. ISSN 0169-4332

[img] PDF
Experimental_investigation_on_material_migration_phenomena_in_micro-EDM_of_reaction-bonded_silicon_carbide.pdf - Published Version

Download (6MB)

Abstract

Material migration between tool electrode and workpiece material in micro electrical discharge machining of reaction-bonded silicon carbide was experimentally investigated. The microstructural changes of workpiece and tungsten tool electrode were examined using scanning electron microscopy, cross sectional transmission electron microscopy and energy dispersive X-ray under various voltage, capacitance and carbon nanofibre concentration in the dielectric fluid. Results show that tungsten is deposited intensively inside the discharge-induced craters on the RB-SiC surface as amorphous structure forming micro particles, and on flat surface region as a thin interdiffusion layer of poly-crystalline structure. Deposition of carbon element on tool electrode was detected, indicating possible material migration to the tool electrode from workpiece material, carbon nanofibres and dielectric oil. Material deposition rate was found to be strongly affected by workpiece surface roughness, voltage and capacitance of the electrical discharge circuit. Carbon nanofibre addition in the dielectric at a suitable concentration significantly reduced the material deposition rate.

Item Type: Article
Subjects: T Technology > TJ Mechanical engineering and machinery
T Technology > TS Manufactures
Divisions: Faculty of Manufacturing Engineering > Department of Manufacturing Process
Depositing User: PAY JUN LIEW
Date Deposited: 04 Feb 2014 01:56
Last Modified: 28 May 2015 04:14
URI: http://eprints.utem.edu.my/id/eprint/10916
Statistic Details: View Download Statistic

Actions (login required)

View Item View Item