Electrical Characteristics Of PMOS Bulk Mosfet And PMOS Silicon-On-Insulator (SOI) MOSFET Device

Muhammad Nazirul Ifwat, Abd Aziz and Fauziyah, Salehuddin and Anis Suhaila, Mohd Zain and Khairil Ezwan, Kaharudin (2016) Electrical Characteristics Of PMOS Bulk Mosfet And PMOS Silicon-On-Insulator (SOI) MOSFET Device. ARPN Journal Of Engineering And Applied Sciences, 11 (10). pp. 6315-6318. ISSN 1819-6608

Text Electrical Characteristics Of PMOS Bulk Mosfet And PMOS Silicon-On-Insulator (SOI) MOSFET Device.pdf - Published Version Download (278kB)

Abstract

Nowadays, conventional Metal Oxide Semiconductor Field Effect Transistor (MOSFET) has been undergoing major improvement. This improvement is about the introduction of technique that buries the Buried Oxide layer in an MOSFET. This method is known as Silicon-on-insulator (SOI) and it is believed to be able to suppress the Short channel effect (SCE). The SCE is a trigger to diminish the electrical characteristics of a MOSFET device and by introducing this buried oxide layer, it can suppress this SCE. With SCE suppressed by buried oxide layer, electrical characteristics of an MOSFET can be improved; thus the performance of the device can increase tremendously. In this paper, Silvaco ATLAS and Silvaco ATHENA modules have been used. ATHENA module is used to design the structure layout of SOI MOSFET device. Meanwhile, ATLAS module is employed to extract electrical characteristics of design structure of the device. Conventional PMOS Bulk MOSFET and SOI PMOS was designed and constructed. These two electrical results have been observed and analyzed. As a conclusion, the SOI PMOS device is clearly superior compared to the bulk PMOS device.

Item Type:	Article
Uncontrolled Keywords:	Athena, Atlas, PMOS, SOI, MOSFET
Subjects:	T Technology > T Technology (General)
Divisions:	Faculty of Electronics and Computer Engineering > Department of Computer Engineering
Depositing User:	Mohd Hannif Jamaludin
Date Deposited:	21 Sep 2016 03:18
Last Modified:	10 Sep 2021 18:59
URI:	http://eprints.utem.edu.my/id/eprint/17195
Statistic Details:	View Download Statistic

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