A Review Paper On Memory Fault Models And Test Algorithms

Hussin, Razaidi and Jidin, Aiman Zakwan and Lee, Weng Fook and Mispan, Mohd Syafiq (2021) A Review Paper On Memory Fault Models And Test Algorithms. Bulletin Of Electrical Engineering And Informatics, 10 (6). pp. 3083-3093. ISSN 2089-3191

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Abstract

Testing embedded memories in a chip can be very challenging due to their high-density nature and manufactured using very deep submicron (VDSM) technologies. In this review paper, functional fault models which may exist in the memory are described, in terms of their definition and detection requirement. Several memory testing algorithms that are used in memory built-in self-test (BIST) are discussed, in terms of test operation sequences, fault detection ability, and also test complexity. From the studies, it shows that tests with 22 N of complexity such as March SS and March AB are needed to detect all static unlinked or simple faults within the memory cells. The N in the algorithm complexity refers to Nx*Ny*Nz whereby Nx represents the number of rows, Ny represents the number of columns and Nz represents the number of banks. This paper also looks into optimization and further improvement that can be achieved on existing March test algorithms to increase the fault coverage or to reduce the test complexity.

Item Type:	Article
Uncontrolled Keywords:	Built-in self-test, Design for testability, March test algorithm, Memory fault model, Random access memory
Divisions:	Faculty of Electrical and Electronic Engineering Technology
Depositing User:	Sabariah Ismail
Date Deposited:	16 Mar 2022 16:19
Last Modified:	16 Mar 2022 16:19
URI:	http://eprints.utem.edu.my/id/eprint/25762
Statistic Details:	View Download Statistic

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