Implementing optimal algorithm for efficient on-chip memory testing using MBIST

Jidin, Aiman Zakwan and Zulkifli, Mohd Faizal and Hussin, Razaidi (2025) Implementing optimal algorithm for efficient on-chip memory testing using MBIST. Penerbit UTeM Press, Durian Tunggal, Melaka. ISBN 9786297741871

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Abstract

This book discusses the implementation of Memory Built-In Self-Test (BIST) for memory testing, including the memory fault models's descriptions, the method to implement a Memory BIST circuitry, and the elaboration on its test algorithm. Memory testing efficiency depends on the test coverage and duration. Hence, selecting an appropriate test algorithm is crucial to achieving an optimal balance between the test quality and cost. This book comprehensively explains the problems and challenges in memory testing and offers several solutions. It helps readers understand the Memory BIST functionality and choose the right test algorithm and implementation technique to optimize fault detections.

Item Type:	Book
Uncontrolled Keywords:	Semiconductor storage devices -- Testing, Integrated circuits -- Testing
Subjects:	T Technology > T Technology (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:	Faculty Of Electronics And Computer Technology And Engineering
Depositing User:	Norhairol Khalid
Date Deposited:	06 Jul 2026 00:40
Last Modified:	06 Jul 2026 00:40
URI:	http://eprints.utem.edu.my/id/eprint/30134
Statistic Details:	View Download Statistic

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