Mohd Rosli, ZULKIFLI and halim, z and azizi, mat yajid and ali, R (2014) Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. Advanced Materials Research. pp. 221-225. ISSN 1022-6680
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Abstract
The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusion which resulted to formation of θ- Al2Cu, η- AlCu, ζ- Al3Cu4 and γ-Al4Cu9 phase.
| Item Type: | Article |
|---|---|
| Subjects: | Q Science > Q Science (General) T Technology > T Technology (General) |
| Divisions: | Faculty of Manufacturing Engineering > Department of Engineering Materials |
| Depositing User: | Dr. Zulkifli Mohd Rosli |
| Date Deposited: | 05 Feb 2014 08:14 |
| Last Modified: | 28 May 2015 04:14 |
| URI: | http://eprints.utem.edu.my/id/eprint/10970 |
| Statistic Details: | View Download Statistic |
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