Mohd Abid, Mohd Asyadi Azam and Mohd Warikh, Abd Rashid (2013) X-ray and morphological characterization of Al-O thin films used for vertically aligned carbon nanotube growth. Advanced Materials Research. pp. 213-218. ISSN 10226680
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Abstract
Al oxide (Al-O) films used as catalyst-support layer for vertical growth of carbon nanotubes (CNTs) were characterized by means of X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission, and scanning electron microscopies (TEM and SEM). EB-deposited Al films (20 nm) were thermally-oxidized at 400 o C (10 min, static air) to produce the surface structure of Al-O. The Al-O was found amorphous and after the incorporation with Co catalyst, the grown CNTs were twisted together before vertically grown. The prepared Al-O surface is an electron-acceptor-dominated (oxygen-rich) surface where the formation of active catalyst could be enhanced to promote the vertically aligned CNT growth.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | XRD, XPS, vertically aligned single-walled carbon nanotube, alcohol catalytic CVD, cobalt catalyst, aluminum oxide support layer. |
| Subjects: | Q Science > Q Science (General) T Technology > TA Engineering (General). Civil engineering (General) |
| Divisions: | Faculty of Manufacturing Engineering > Department of Engineering Materials |
| Depositing User: | Dr Mohd Asyadi 'Azam Bin Mohd Abid |
| Date Deposited: | 14 Nov 2012 10:05 |
| Last Modified: | 24 Jan 2022 14:17 |
| URI: | http://eprints.utem.edu.my/id/eprint/6433 |
| Statistic Details: | View Download Statistic |
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