Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.

Mohd Rosli, ZULKIFLI and halim, z and azizi, mat yajid and ali, R (2014) Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. Advanced Materials Research. pp. 221-225. ISSN 1022-6680

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Abstract

The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusion which resulted to formation of θ- Al2Cu, η- AlCu, ζ- Al3Cu4 and γ-Al4Cu9 phase.

Item Type: Article
Subjects: Q Science > Q Science (General)
T Technology > T Technology (General)
Divisions: Faculty of Manufacturing Engineering > Department of Engineering Materials
Depositing User: Dr. Zulkifli Mohd Rosli
Date Deposited: 05 Feb 2014 08:14
Last Modified: 28 May 2015 04:14
URI: http://eprints.utem.edu.my/id/eprint/10970
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