X-ray and morphological characterization of Al-O thin films used for vertically aligned carbon nanotube growth

Mohd Abid, Mohd Asyadi Azam and Mohd Warikh, Abd Rashid (2013) X-ray and morphological characterization of Al-O thin films used for vertically aligned carbon nanotube growth. Advanced Materials Research. pp. 213-218. ISSN 10226680

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Abstract

Al oxide (Al-O) films used as catalyst-support layer for vertical growth of carbon nanotubes (CNTs) were characterized by means of X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission, and scanning electron microscopies (TEM and SEM). EB-deposited Al films (20 nm) were thermally-oxidized at 400 o C (10 min, static air) to produce the surface structure of Al-O. The Al-O was found amorphous and after the incorporation with Co catalyst, the grown CNTs were twisted together before vertically grown. The prepared Al-O surface is an electron-acceptor-dominated (oxygen-rich) surface where the formation of active catalyst could be enhanced to promote the vertically aligned CNT growth.

Item Type: Article
Subjects: Q Science > Q Science (General)
T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Manufacturing Engineering > Department of Engineering Materials
Depositing User: Dr Mohd Asyadi 'Azam Bin Mohd Abid
Date Deposited: 14 Nov 2012 10:05
Last Modified: 28 May 2015 03:42
URI: http://eprints.utem.edu.my/id/eprint/6433
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